Narrow-sense heritabilities for reaction to chlorotic leaf distortion (CLD), incited by Fusarium lateritium Nees: Fr., were estimated in sweetpotato [Ipomoea batatas (L.) Lam] by variance component analysis and parent–offspring regression. Visually rated severity reactions to CLD varied greatly among the 20 parents used to generate half-sib progeny from open-pollinated nurseries in 1990 and 1991. Progeny from each nursery were evaluated along with parents in a completely randomized design in two consecutive years. Narrow-sense heritability (h 2) estimates based on variance components were moderate on an entry mean basis at 0.61 in 1990, 0.38 in 1991, and 0.33 for the two years combined. Slightly higher, but still moderate, estimates were obtained on an individual plant basis. Narrow-sense heritability estimates using parent–offspring regression were 0.35 in 1990, 0.33 in 1991, and 0.33 for the two years combined. Predicted next-generation response was highest using a half-sib family recurrent selection among three schemes compared at a 10% selection intensity. Our data indicate –0.63 improvement in the half-sib family CLD severity rating in one breeding cycle.