Molecular Markers Associated with Plant Architecture and Resistance to Common Blight, Web Blight, and Rust in Common Beans

in Journal of the American Society for Horticultural Science
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  • 1 Department of Horticulture, University of Nebraska, Lincoln, NE 68583
  • | 2 Department of Horticulture, University of Wisconsin, Madison, WI 53706
  • | 3 Arroyo Loro Experiment Station, San Juan de la Maguana, Dominican Republic
  • | 4 Department of Horticulture, University of Nebraska, Lincoln, NE 68583
  • | 5 Department of Plant Pathology, University of Nebraska, Lincoln, NE 68583
  • | 6 Department of Agronomy and Soils, University of Puerto Rico, Mayaguez, PR 00681
  • | 7 Department of Agronomy, University of Wisconsin, Madison, WI 53706

Random amplified polymorphic DNA (RAPD) markers were used to construct a partial linkage map in a recombinant inbred population derived from the common bean (Phaseolus vulgaris L.) cross BAC 6 × HT 7719 for studying the genetics of disease resistance in common bean. The linkage map spanned 545 cM and included 75 of 84 markers used in this study. The population of 128 recombinant inbred lines was evaluated for resistance to common bacterial blight, foliar resistance to web blight [WB; Thanatephorus cucumeris (Frank) Donk], and resistance to rust [Uromyces appendiculatus var. appendiculatus (Pers.:Pers) Unger]. Common bacterial blight [CBB; Xanthomonas campestris pv. phaseoli (Smith) Dye] resistance was evaluated for CBB strain Epif-IV in later-developed trifoliolate leaves and for CBB strain EK-11 in seeds, first trifoliolate leaves, later-developed trifoliolate leaves, and pods. In addition, lines were rated for plant uprightness and branch density. Two to six markers accounted for 14% to 34% of the phenotypic variation for each trait. Significant marker locustrait associations were found for 14 mapped loci and 7 of the 9 unmapped markers. The distribution of detected QTL appeared to be nonrandom with most significant markers associated with more than one trait or closely linked to markers significantly associated with variation for a different trait. One marker, BC4091250, was significantly associated with WB resistance, resistance for CBB strain Epif-IV in later-developed trifoliolate leaves, and resistance for CBB strain EK-11 in first trifoliolate leaves, later-developed trifoliolate leaves, and pods. A rust resistance gene was mapped in an interval 14.6 cM from RAPD marker H191050 and 12.5 cM from marker AJ16250.

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