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Surface Characteristics of American Elm Clones for Identification by Scanning Electron Microscopy1

Author:
Charles R. Krause Nursery Crops Research Laboratory, Agricultural Research Service, U.S. Department of Agriculture, Delaware, OH 43015

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Charles R. Krause Nursery Crops Research Laboratory, Agricultural Research Service, U.S. Department of Agriculture, Delaware, OH 43015

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Contributor Notes

Received for publication February 17, 1976. Supported in part by a grant from the Horticultural Research Institute Inc., Washington, D.C. Mention of a trademark or proprietary product does not constitute a guarantee or warranty of the product by the U.S. Department of Agriculture and does not imply its approval to the exclusion of other products that may also be suitable.

Research Plant Pathologist.

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